Command Reference  3.  Attributes and Variables write_test_variables



NAME
          write_test_variables
                         Variables that affect the write_test
                         command.


SYNTAX
          list write_test_formats = {"synopsys", "tssi_ascii", "tds", "verilog", "vhdl", "wgl"}
          string write_test_include_scan_cell_info = "true"
          string write_test_input_dont_care_value = "X"
          int write_test_max_cycles = 0
          int write_test_max_scan_patterns = 0
          string write_test_pattern_set_naming_style = "TC_Syn_%d"
          string write_test_scan_check_file_naming_style = "%s_schk.%s"
          string write_test_vector_file_naming_style = "%s_%d.%s"


DESCRIPTION
          These variables directly affect the write_test command.
          Defaults are shown above, under Syntax.

          For a list of these variables and their current values,
          type list -variables write_test.

          To view this manual page online, type help
          write_test_variables.  To view an individual variable
          description, type help var, where var is the variable
          name.


          write_test_formats
                         Specifies the test vector formats
                         recognized and created by the write_test
                         command.


          write_test_include_scan_cell_info
                         Provides a mechanism to specify that the
                         scan-chain/cell/inversion information
                         should not be included in vector files.
                         By default, this variable is set TRUE.


          write_test_input_dont_care_value
                         Controls the logic value output by the
                         write_test command when you have an
                         input with a don't-care condition.


          write_test_max_cycles
                         Allows the user to control the automatic
                         partitioning of long test sets across



V3.1      Synopsys Inc. 1988-1994. All rights reserved.       3-1

write_test_variables3.  Attributes and Variables   Command Reference



                         multiple files by specifying the maximum
                         number of tester cycles to be contained
                         in any one vector file.


          write_test_max_scan_patterns
                         Allows the user to control the automatic
                         partitioning of long test sets across
                         multiple files by specifying the maximum
                         number of scan-test patterns to be
                         contained in any one vector file.












































3-2       Synopsys Inc. 1988-1994. All rights reserved.      V3.1

Command Reference  3.  Attributes and Variables write_test_variables



          write_test_pattern_set_naming_style
                         Specifies how patterns sets are named
                         when long test sets are partitioned
                         across multiple files.


          write_test_scan_check_file_naming_style
                         Specifies how to name the file
                         containing the vectors which test the
                         scan chain logic.


          write_test_vector_file_naming_style
                         Specifies how scan vector file names are
                         derived, especially when long test sets
                         must be split across multiple files.


SEE ALSO
          write_test(2)



































V3.1      Synopsys Inc. 1988-1994. All rights reserved.       3-3